Abstract: Statistical process control (SPC) is a process management design which encompasses the definition, measurement, control, monitor and improvement of processes using statistical knowledge. Control charts are the most appropriate and efficient statistical process control (SPC) tools in measuring the product quality. To observe the product development from a process, SPC is technique with an assumption that the products produced under the same circumstances do not always have the same quality feature(s). However, if the deviations found are within reasonable bounds, SPC methods would allow them to be accepted. To evaluate the quality and reliability of the product, SPC approach is taken by establishing certain measures of quality and presuming a probability distribution for quality metrics. The proposed new weighted exponential distribution (NWED) model is considered to determine product reliability, which involves the estimation of the mean value function parameters considered as a quality feature and therefore the control charts are developed using those data. This study includes a mechanism for monitoring product quality based on cumulative time-domain failure data order statistics using a mean value function of new weighted exponential distribution (NWED) on the basis of non-homogeneous Poisson process (NHPP). The quality control limitations are developed by using failure time data and are compared to well-known exponential distribution (ED) life failure model. Lastly, the results derived from the proposed (NWED) and the existing (ED) models are illustrated for comparison. |
Keywords and phrases: ED, NHPP, NWED, SPC, SQC.
Received: October 1, 2021; Accepted: December 7, 2021; Published: December 27, 2021
How to cite this article: Anil Arepalli and B. Srinivasa Rao, Time control charts through NHPP based on new weighted exponential distribution, Advances and Applications in Statistics 72 (2022), 97-111. DOI: 10.17654/0972361722007
This Open Access Article is Licensed under Creative Commons Attribution 4.0 International License
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