The multiple deferred state sampling inspection plan, a distinct  special purpose sampling plan, inspects the quality of subsequent lot in addition to the present lot to reach a decision on acceptance or non-acceptance of lots of manufactured products. The process of capability indices is one of the statistical methodologies in statistical process control, extensively employed to assess the capability of the production process in accordance with its manufacturing specifications. This article suggests a variable multiple deferred state sampling inspection plan for unilateral specification based on one-sided process capability index. The suggested plan is developed with respect to the exact sampling distribution of the estimated index. The proposed plan parameters are achieved by minimizing the average sample number for specific capability requirements assuring the producer and consumer conservation. The importance of the proposed plan is discussed.

conditional sampling plan, multiple deferred state sampling plan, process capability index, operating characteristic function, average sample number.

Received: June 14, 2022; Accepted: July 25, 2022; Published: August 18, 2022

How to cite this article: S. Geetha and Raichel Mathew, Multiple deferred state sampling inspection plan for variables based on one-sided process capability index, Far East Journal of Theoretical Statistics 66 (2022), 1-14. http://dx.doi.org/10.17654/0972086322011

This Open Access Article is Licensed under Creative Commons Attribution 4.0 International License

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